St. Louis, MO, United States of America

Hui Wang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Washington University. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hui Wang. Retrieved from https://idiyas.com/inventor/hui-wang-w7a88v7o

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Hui Wang - Innovator in Electromyometrial Imaging

Introduction

Hui Wang is a notable inventor based in St. Louis, MO (US). She has made significant contributions to the field of electromyometrial imaging, focusing on non-invasive monitoring techniques for uterine contractions.

Latest Patents

Hui Wang holds a patent for "Systems and methods for electromyometrial imaging." This patent describes systems, devices, and methods for monitoring uterine contractions non-invasively using surface electrode measurements. Her innovative approach aims to enhance the accuracy and comfort of monitoring during pregnancy.

Career Highlights

Hui Wang is affiliated with Washington University, where she continues to advance her research and development in medical technologies. Her work is pivotal in improving maternal health care through innovative imaging techniques.

Collaborations

Hui collaborates with esteemed colleagues, including Yong Wang and Wenjie Wu, to further her research initiatives and explore new applications of her inventions.

Conclusion

Hui Wang's contributions to electromyometrial imaging represent a significant advancement in non-invasive medical monitoring. Her work not only enhances the understanding of uterine contractions but also improves the overall experience for expectant mothers.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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