Shenzhen, China

Hui-Ling Feng

This inventor holds 3 USPTO granted patents. Top assignees: Hon Hai Precision Industry Co., Ltd., Hong-Fu Jin Precision Industry (Shenzhen) Co., Ltd.. Active years: 2012-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hui-Ling Feng. Retrieved from https://idiyas.com/inventor/hui-ling-feng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 33.3

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2012-2015

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3 patents (USPTO):Explore Patents

Title: Hui-Ling Feng: Innovator in Audio Testing Technology

Introduction

Hui-Ling Feng is a prominent inventor based in Shenzhen, China. She has made significant contributions to the field of audio technology, holding a total of 3 patents. Her innovative work focuses on developing systems that enhance audio testing and quality assurance.

Latest Patents

Hui-Ling Feng's latest patents include an audio testing system and method designed to receive audio signals from audio emitting devices. This system samples the audio signal and obtains sampling points to determine if the audio signal has been distorted. A related method is also disclosed, showcasing her commitment to improving audio quality and testing methodologies.

Career Highlights

Throughout her career, Hui-Ling has worked with notable companies such as Hong-Fu Jin Precision Industry (Shenzhen) Co., Ltd. and Hon Hai Precision Industry Co., Ltd. Her experience in these organizations has allowed her to refine her skills and contribute to advancements in audio technology.

Collaborations

Hui-Ling Feng has collaborated with talented individuals in her field, including Yi Lo and Guo-Zhong Liu. These partnerships have fostered innovation and creativity in her projects.

Conclusion

Hui-Ling Feng is a dedicated inventor whose work in audio testing technology has made a significant impact. Her patents and collaborations reflect her expertise and commitment to advancing the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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