This inventor holds 1 USPTO granted patent. Top assignee: National University of Defense Technology. Active years: 2016.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2016
Title: Hui Jia - Innovator in Dynamic Attitude Measurement
Introduction
Hui Jia is a prominent inventor based in Hunan, China. He has made significant contributions to the field of dynamic attitude measurement, particularly through his innovative patent. His work is essential for advancements in sensor technology, which has applications in various industries.
Latest Patents
Hui Jia holds a patent titled "Dynamic attitude measurement method of star sensor based on gyro's precise angular correlation." This patent discloses a method that enhances the accuracy of star sensors by performing dynamic compensation on measurement exposure frames. The method involves obtaining a transform matrix between adjacent measurement frames, which is precisely measured using a unit that includes three gyros. This innovation allows for the establishment of a correlated measurement equation, processing a series of measurement frames as a single frame, thereby improving measurement accuracy.
Career Highlights
Hui Jia is affiliated with the National University of Defense Technology, where he continues to contribute to research and development in sensor technologies. His expertise in dynamic attitude measurement has positioned him as a key figure in this specialized field.
Collaborations
Hui Jia has collaborated with notable colleagues, including Shiqiao Qin and Dejun Zhan. Their combined efforts in research have furthered advancements in sensor technology and dynamic measurement methods.
Conclusion
Hui Jia's innovative work in dynamic attitude measurement has made a significant impact on sensor technology. His contributions are vital for future advancements in this field, showcasing the importance of innovation in enhancing measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile