Tainan, Taiwan

Hui-jen Chen

This inventor holds 1 USPTO granted patent. Top assignee: Ritek Corporation. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hui-jen Chen. Retrieved from https://idiyas.com/inventor/hui-jen-chen-xlvhnope

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Hui-jen Chen: Innovator in Optical Recording Technology

Introduction

Hui-jen Chen is a notable inventor based in Tainan, Taiwan. He has made significant contributions to the field of optical recording technology. His innovative work has led to the development of advanced materials that enhance the performance of optical recording media.

Latest Patents

Hui-jen Chen holds a patent for "Asymmetrical trimethine cyanine dyes for high capacity optical recording medium." This patent involves an optical recording layer that comprises a dye material represented by a specific formula. His invention aims to improve the efficiency and capacity of optical recording devices.

Career Highlights

Hui-jen Chen is associated with Ritek Corporation, a leading company in the optical storage industry. His role at Ritek has allowed him to focus on research and development in optical recording technologies. His expertise has contributed to the company's advancements in high-capacity storage solutions.

Collaborations

Hui-jen Chen has collaborated with notable colleagues, including Chang-sheng Huang and Mei-jung Hu. These partnerships have fostered innovation and have been instrumental in the development of new technologies in the field.

Conclusion

Hui-jen Chen's contributions to optical recording technology exemplify the impact of innovative thinking in advancing storage solutions. His work continues to influence the industry and pave the way for future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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