This inventor holds 1 USPTO granted patent. Top assignee: Micrel, Incorporated. Active years: 2003.
Company Filing History:
Years Active: 2003
Title: Hui F Ip - Innovator in Electrical Print Resolution Testing
Introduction
Hui F Ip is a notable inventor based in San Jose, CA (US). He has made significant contributions to the field of electrical print resolution testing. His innovative approach has led to the development of a unique test structure pattern that enhances the quality and reliability of printed electrical components.
Latest Patents
Hui F Ip holds a patent for an "Electrical print resolution test die." This patent describes a test structure pattern that includes a first comb, a second comb, and a serpentine line. The first comb features a first set of tines oriented in the same direction, while the second comb has a second set of tines that are interdigitated with the first set. The serpentine line runs between the interdigitated tines of both combs. This design allows for effective testing of print quality and resolution by checking for electrical continuity in the serpentine metal line and ensuring there is no bridging between the serpentine line and the combs. Hui F Ip has 1 patent to his name.
Career Highlights
Hui F Ip is currently employed at Micrel, Incorporated, where he continues to innovate and contribute to advancements in electrical testing technologies. His work has been instrumental in improving the accuracy and efficiency of print resolution tests.
Collaborations
Hui has collaborated with notable colleagues, including Robert W Rumsey and Arthur Lam. Their combined expertise has fostered a productive environment for innovation and development within their field.
Conclusion
Hui F Ip's contributions to electrical print resolution testing exemplify the impact of innovative thinking in technology. His patent and work at Micrel, Incorporated highlight his commitment to advancing the industry.