This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2000.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2000
Title: Innovations of Hui Cheng Zhou
Introduction
Hui Cheng Zhou is an accomplished inventor based in Wuhan, China. He has made significant contributions to the field of machine vision and inspection technologies. His innovative approach has led to the development of a unique inspection method that enhances accuracy and efficiency.
Latest Patents
Hui Cheng Zhou holds a patent for a Computer Aided Inspection Machine. This invention involves an automatic inspection method and apparatus that utilizes structured light and machine vision cameras to inspect objects. The system analyzes camera images to produce three-dimensional locations of points on the object's surfaces. During the setup phase, points are evaluated against a geometric model to minimize data collection and analysis time. The inspection device employs multiple sensors, each consisting of a camera and a structured light source, allowing for comprehensive measurements of the object in a single pass. Calibration and compensation methods are also integral to this invention.
Career Highlights
Throughout his career, Hui Cheng Zhou has demonstrated a commitment to advancing inspection technologies. His work has not only improved the accuracy of measurements but has also streamlined the inspection process for various applications. His innovative solutions have garnered attention in the industry.
Collaborations
Hui Cheng Zhou has collaborated with notable colleagues, including B Shawn Buckley and Jihong Chen. These partnerships have contributed to the development and refinement of his inventions.
Conclusion
Hui Cheng Zhou's contributions to the field of machine vision and inspection technologies exemplify the impact of innovation on industry practices. His patented methods enhance the accuracy and efficiency of inspections, showcasing the importance of continuous advancement in technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile