Taipei, Taiwan

Huei-Li Huang

This inventor holds 1 USPTO granted patent. Top assignee: Ching-Ray Chang. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Huei-Li Huang. Retrieved from https://idiyas.com/inventor/huei-li-huang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Innovations of Huei-Li Huang

Introduction

Huei-Li Huang is a notable inventor based in Taipei, Taiwan. She has made significant contributions to the field of magnetic recording technology. Her innovative work has led to the development of a unique magnetic recording medium.

Latest Patents

Huei-Li Huang holds a patent for a "Perpendicular magnetic recording medium and method for fabricating the same." This invention includes a substrate, a base layer, an intermediate layer, and a recording layer that consists of a magnetic matrix with a plurality of non-magnetic particles percolated within it. This advancement enhances the efficiency and effectiveness of magnetic recording media.

Career Highlights

Huei-Li Huang is associated with Ching-Ray Chang, where she continues to push the boundaries of technology. Her work has been recognized for its innovative approach and practical applications in the industry. She has a total of 1 patent to her name, showcasing her commitment to advancing technology.

Collaborations

Huei-Li Huang has collaborated with talented individuals such as An-Cheng Sun and Po-Cheng Kuo. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Huei-Li Huang's contributions to the field of magnetic recording technology exemplify her dedication to innovation. Her patent and collaborations highlight her role as a significant figure in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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