Jena, Germany

Hubert Pohlack

This inventor holds 1 USPTO granted patent. Top assignee: Jenoptik Gmbh. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hubert Pohlack. Retrieved from https://idiyas.com/inventor/hubert-pohlack-uovvxjpl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hubert Pohlack

Introduction

Hubert Pohlack is a notable inventor based in Jena, Germany. He has made significant contributions to the field of technology, particularly in radiation projection systems. His work has led to the development of innovative solutions that enhance the functionality and safety of radiation applications.

Latest Patents

Hubert Pohlack holds a patent for a "Radiation projection arrangement with integrated radiation indicator." This invention showcases his expertise in creating advanced systems that improve the monitoring and management of radiation exposure.

Career Highlights

Pohlack is currently employed at Jenoptik GmbH, a company renowned for its cutting-edge technology and solutions in optics and photonics. His role at Jenoptik has allowed him to collaborate with other talented professionals and contribute to groundbreaking projects.

Collaborations

One of his notable coworkers is Erik Hacker, with whom he has likely shared insights and expertise in their respective fields. Their collaboration exemplifies the importance of teamwork in driving innovation.

Conclusion

Hubert Pohlack's contributions to the field of radiation technology highlight his role as an influential inventor. His patent and work at Jenoptik GmbH demonstrate his commitment to advancing technology for better safety and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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