This inventor holds 1 USPTO granted patent. Top assignee: Ta Instruments, Inc.. Active years: 2001.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2001
Title: Hubert Murray Montague-Pollock: Innovator in Mechano-Thermal Analysis
Introduction
Hubert Murray Montague-Pollock is a notable inventor based in Carnforth, GB. He has made significant contributions to the field of localized dynamic mechano-thermal analysis. His innovative work has led to the development of a unique system and method that enhances the capabilities of scanning probe microscopy.
Latest Patents
Montague-Pollock holds a patent for a "Method and apparatus for localized dynamic mechano-thermal analysis with scanning probe microscopy." This patent describes a system that allows for the performance of localized mechanothermal analysis. In this method, an image of the surface or subsurface of a sample is created. A localized region of the sample is selected from this image. A scanning microscope is then used to position an active or passive thermal probe at the selected region. A temperature ramp is applied to this localized area, along with a dynamic or modulated stress or strain. The resulting force data from the applied temperature and stress or strain is collected and processed to produce a graph or fingerprint of the dynamic mechanical and/or calorimetric properties of the selected localized region.
Career Highlights
Montague-Pollock is currently associated with TA Instruments, Inc., where he continues to advance his research and development efforts. His work has been instrumental in enhancing the understanding of material properties at localized levels.
Collaborations
Some of his notable coworkers include Azzedine Hammiche and Michael Reading. Their collaborative efforts have contributed to the success of various projects within the field.
Conclusion
Hubert Murray Montague-Pollock is a distinguished inventor whose work in mechano-thermal analysis has paved the way for advancements in scanning probe microscopy. His innovative patent reflects his commitment to enhancing scientific understanding and technological capabilities.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
