This inventor holds 1 USPTO granted patent. Top assignee: Ta Instruments, Inc.. Active years: 2002.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2002
Title: Hubert Murray Montagu-Pollock: Innovator in Thermal Analysis
Introduction
Hubert Murray Montagu-Pollock is a notable inventor based in Carnforth, GB. He has made significant contributions to the field of thermal analysis through his innovative methods and apparatus. His work focuses on enhancing the understanding of material properties at a microscopic level.
Latest Patents
Montagu-Pollock holds a patent for a "Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy." This invention utilizes a platinum/rhodium resistance thermal probe, which serves as both a localized heat source and a detector. The probe enables localized differential calorimetry by thermally inducing and detecting events such as glass transitions, meltings, recrystallizations, and thermal decomposition within volumes of material estimated at a few micrometers. Additionally, it is capable of imaging variations in thermal conductivity and diffusivity, performing depth profiling, and sub-surface imaging. The maximum depth of the sample that is imaged is controlled by generating and detecting evanescent temperature waves in the sample. Montagu-Pollock has 1 patent to his name.
Career Highlights
Montagu-Pollock is currently associated with TA Instruments, Inc., where he continues to advance the field of thermal analysis. His work has been instrumental in developing techniques that enhance the precision of thermal measurements in various materials.
Collaborations
He has collaborated with notable colleagues such as Azzedine Hammiche and Michael Reading, contributing to the advancement of thermal analysis technologies.
Conclusion
Hubert Murray Montagu-Pollock's innovative work in thermal analysis has paved the way for new methodologies in material science. His contributions are significant in understanding the thermal properties of materials at a microscopic level.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
