This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2018.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2018
Title: Huay-Chung Liou: Innovator in Distance Measurement Technology
Introduction
Huay-Chung Liou is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of distance measurement technology. His innovative approach has led to the development of a unique device that enhances the accuracy and efficiency of distance measurement.
Latest Patents
Liou holds a patent for a "Distance measuring device and distance measuring method thereof." This invention features an absolute distance measuring module, a tracking module, a two-axis rotating mechanism, and a signal controlling and processing module. The device is designed to track an object and measure the distance between the device and the object accurately. The absolute distance measuring module works in conjunction with the tracking module, utilizing a dichroic beam splitter to ensure precise measurements. The system is capable of adapting to changes in the optical path as the object moves, thereby maintaining measurement accuracy.
Career Highlights
Liou is affiliated with the Industrial Technology Research Institute, where he has been instrumental in advancing research and development in measurement technologies. His work has garnered attention for its practical applications in various industries.
Collaborations
Liou has collaborated with notable colleagues, including Hau-Wei Lee and Po-Er Hsu, contributing to a dynamic research environment that fosters innovation and technological advancement.
Conclusion
Huay-Chung Liou's contributions to distance measurement technology exemplify the spirit of innovation. His patented device represents a significant advancement in the field, showcasing his expertise and commitment to enhancing measurement accuracy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
