Chengdu, China

Huashan Lan

This inventor holds 1 USPTO granted patent. Top assignee: Southwest Petroleum University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Huashan Lan. Retrieved from https://idiyas.com/inventor/huashan-lan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Huashan Lan: Innovator in Optical Measurement Technology

Introduction

Huashan Lan is a notable inventor based in Chengdu, China. He has made significant contributions to the field of optical measurement technology. His innovative work focuses on enhancing the accuracy and efficiency of viewing angle measurements for optical components.

Latest Patents

Huashan Lan holds a patent for a dual-dial measurement device and a measurement method for viewing angle measurement of optical components. This device features a support frame, a large dial, a small dial, a vernier disc, verniers, and an objective table. The invention allows for precise measurement of the effective viewing angle of optical components by utilizing a symmetrical light source to evaluate the exit angle of light.

Career Highlights

Huashan Lan is affiliated with Southwest Petroleum University, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications in various optical systems.

Collaborations

He collaborates with colleagues Yi Qiu and Wei Wang, contributing to a dynamic research environment focused on innovation in optical measurement.

Conclusion

Huashan Lan's contributions to optical measurement technology exemplify the impact of innovative thinking in engineering. His patented device represents a significant advancement in the field, providing valuable tools for evaluating optical components.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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