Vancouver, Canada

Hsin Yuan Chang

This inventor holds 3 USPTO granted patents. Top assignee: Meta Materials Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsin Yuan Chang. Retrieved from https://idiyas.com/inventor/hsin-yuan-chang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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3 patents (USPTO):Explore Patents

Title: Hsin Yuan Chang: Innovator in Security Document Technology

Introduction

Hsin Yuan Chang is a notable inventor based in Vancouver, Canada. He has made significant contributions to the field of security documents, holding a total of three patents. His work focuses on enhancing the security features of various important documents.

Latest Patents

Chang's latest patents include innovations related to banknotes, identification cards, passports, checks, security documents, government stamps, vehicle registrations, and packages. Each of these inventions incorporates advanced security features designed to prevent counterfeiting and enhance document integrity.

Career Highlights

Hsin Yuan Chang is currently employed at Meta Materials Inc., where he continues to develop cutting-edge technologies. His expertise in security features has positioned him as a key player in the industry, contributing to the advancement of secure document technologies.

Collaborations

Chang collaborates with various professionals in his field, including his coworker Clinton Kenneth Landrock. Together, they work on innovative projects that aim to improve the security and reliability of essential documents.

Conclusion

Hsin Yuan Chang's contributions to the field of security documents highlight his innovative spirit and dedication to enhancing document security. His patents reflect a commitment to advancing technology in a critical area of public trust.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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