Company Filing History:
Years Active: 2006
Title: Hsien-Te Lo: Innovator in Semiconductor Inspection Methods
Introduction
Hsien-Te Lo is a notable inventor based in Taoyuan County, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in inspection methods that enhance the reliability and performance of semiconductor devices.
Latest Patents
Hsien-Te Lo holds a patent for an innovative inspection method for semiconductor devices. This method involves providing a semiconductor device, performing heat treatment on it, and utilizing an electron beam to inspect the device and acquire an analysis image. The semiconductor device includes a substrate, multiple gate electrodes protruding from the substrate, a blanket dielectric layer overlying both the substrate and gate electrodes, and several polycrystalline silicon plugs positioned between the gate electrodes within the dielectric layer. The analysis image is crucial for detecting piping defects by revealing areas with voltage contrast differences. He has 1 patent to his name.
Career Highlights
Hsien-Te Lo is associated with Powerchip Semiconductor Corporation, where he applies his expertise in semiconductor technology. His work focuses on improving inspection methods that are vital for the production of high-quality semiconductor devices.
Collaborations
Hsien-Te Lo collaborates with talented colleagues, including Long-Hui Lin and Chia-Yun Chen, who contribute to the innovative environment at Powerchip Semiconductor Corporation.
Conclusion
Hsien-Te Lo's contributions to semiconductor inspection methods exemplify his commitment to advancing technology in this critical field. His innovative approaches continue to influence the industry and enhance the quality of semiconductor devices.