Hsinchu, Taiwan

Hsien-Po Hsiesh

This inventor holds 1 USPTO granted patent. Top assignee: Industrial Technology Research Institute. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsien-Po Hsiesh. Retrieved from https://idiyas.com/inventor/hsien-po-hsiesh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Hsien-Po Hsiesh: Innovator in Real-Time Dispenser Fault Detection

Introduction

Hsien-Po Hsiesh is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of adhesive dispensing technology. His innovative approach focuses on enhancing the accuracy and reliability of adhesive application processes.

Latest Patents

Hsien-Po Hsiesh holds a patent for a "Real-time dispenser fault detection and classification method." This invention involves monitoring adhesive dots dispensed on a substrate by a dispenser. The method includes capturing images of the adhesive dots immediately after they are formed and comparing the topology data of these images with predetermined data. This comparison helps in assessing the operational condition of the dispenser, ensuring optimal performance.

Career Highlights

Hsien-Po Hsiesh is affiliated with the Industrial Technology Research Institute, where he applies his expertise in developing advanced technologies. His work has been instrumental in improving manufacturing processes and enhancing product quality in various applications.

Collaborations

Hsien-Po has collaborated with esteemed colleagues, including Ching-Shun Chen and Tsu-Kuang Yang. Their combined efforts have contributed to the advancement of technology in their field.

Conclusion

Hsien-Po Hsiesh's innovative work in real-time dispenser fault detection exemplifies the importance of precision in manufacturing processes. His contributions continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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