Taipei, Taiwan

Hsien-Hua Li

This inventor holds 1 USPTO granted patent. Top assignee: Hannstar Display Corporation. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsien-Hua Li. Retrieved from https://idiyas.com/inventor/hsien-hua-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Hsien-Hua Li: Innovator in Liquid Crystal Display Technology

Introduction

Hsien-Hua Li is a prominent inventor based in Taipei Shien, Taiwan. He has made significant contributions to the field of liquid crystal display (LCD) technology. His innovative approach to repairing defects in LCDs has garnered attention in the industry.

Latest Patents

Hsien-Hua Li holds a patent for a process aimed at repairing defects in liquid crystal displays. The patent, titled "Process for repairing defect applied in liquid crystal display," outlines a method that includes providing a laser with an infrared spectrum wavelength. The process involves welding a repair circuit from the back of the LCD to effectively address and repair defects.

Career Highlights

Li is associated with Hannastar Display Corporation, where he applies his expertise in LCD technology. His work has been instrumental in advancing the quality and reliability of liquid crystal displays in various applications.

Collaborations

Hsien-Hua Li has collaborated with notable colleagues, including Jia-Shyong Cheng and Shou-Jen Chang. Their combined efforts have contributed to the development of innovative solutions in the display technology sector.

Conclusion

Hsien-Hua Li's contributions to liquid crystal display technology through his innovative patent demonstrate his commitment to enhancing display quality. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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