Shenyiang, Taiwan

Hsiao-Li Kao

This inventor holds 1 USPTO granted patent. Top assignee: Lite-On Technology Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsiao-Li Kao. Retrieved from https://idiyas.com/inventor/hsiao-li-kao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Hsiao-Li Kao: Innovator in Optical Scanning Technology

Introduction

Hsiao-Li Kao is a prominent inventor based in Shenyiang, Taiwan. He has made significant contributions to the field of optical scanning technology. His innovative approach has led to the development of a unique optical scanner that enhances image quality and scanning efficiency.

Latest Patents

Hsiao-Li Kao holds a patent for an optical scanner. This device includes a first reference white board and a second reference white board that are perpendicular to two sides of a glass window, which holds the object to be scanned. When powered on, the optical module scans both reference white boards to gather data for image quality testing and brightness variations in the Y direction. Through software compensation and correction, the scanner produces a normal digital image, enabling rapid preview and scanning. He has 1 patent to his name.

Career Highlights

Kao is currently employed at Lite-On Technology Corporation, where he continues to innovate and develop advanced optical scanning solutions. His work has been instrumental in improving the efficiency and effectiveness of scanning technologies.

Collaborations

Hsiao-Li Kao has collaborated with notable colleagues, including Ta-Yi Lee and Tung-Fu Hsieh. Their combined expertise has contributed to the advancement of optical scanning technologies.

Conclusion

Hsiao-Li Kao's contributions to optical scanning technology demonstrate his commitment to innovation and excellence in the field. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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