Hsinchu, Taiwan

Hsiang-Jen Yang

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Taiwan Mask Corporation. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hsiang-Jen Yang. Retrieved from https://idiyas.com/inventor/hsiang-jen-yang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Hsiang-Jen Yang: Innovator in Mask Testing Technology

Introduction

Hsiang-Jen Yang is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of mask testing technology. His innovative approach has led to the development of a unique method that enhances the quality assurance processes for mask articles.

Latest Patents

Hsiang-Jen Yang holds a patent for a "Method for testing mask articles." This method involves several steps, including electrically connecting the mask article to an electrical sensor, applying a bias voltage to multiple testing sites, measuring current distributions, and determining the quality of the mask article based on these measurements. This patent represents a significant advancement in ensuring the reliability and effectiveness of mask products.

Career Highlights

Hsiang-Jen Yang is currently associated with Taiwan Mask Corporation, where he applies his expertise in developing innovative testing methods. His work has been instrumental in improving the standards of mask production and testing.

Collaborations

Hsiang-Jen Yang collaborates with talented individuals such as Ming-Chih Chen and Chen-Rui Tseng, who contribute to the innovative environment at Taiwan Mask Corporation.

Conclusion

Hsiang-Jen Yang's contributions to mask testing technology exemplify the importance of innovation in ensuring product quality. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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