Yerevan, Armenia

Hrant Marandjian


Average Co-Inventor Count = 4.3

ph-index = 3

Forward Citations = 86(Granted Patents)


Company Filing History:


Years Active: 1999-2000

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3 patents (USPTO):Explore Patents

Title: Hrant Marandjian: Innovator in Integrated Circuit Testing

Introduction

Hrant Marandjian is a notable inventor based in Yerevan, Armenia. He has made significant contributions to the field of integrated circuit testing, holding a total of 3 patents. His work focuses on improving the efficiency and quality of built-in self-test (BIST) functions for embedded memories.

Latest Patents

Marandjian's latest patents include a method and apparatus for built-in self-test of integrated circuits. This innovative BIST function minimizes the routing area for test signals while allowing for the testing of multiple embedded memories at full speed in parallel. This approach not only reduces test time but also enhances the quality of the testing process. Another significant patent is for an efficient built-in self-test for embedded memories with differing sizes. This BIST circuit tests one or more embedded memories by writing data to each memory address, reading it back, and comparing the input and output data. The circuit includes data generators and identical address generators, allowing for effective testing regardless of the memory size.

Career Highlights

Hrant Marandjian is currently employed at Credence Systems Corporation, where he continues to develop innovative solutions in the field of integrated circuits. His expertise in BIST technology has positioned him as a key player in enhancing testing methodologies.

Collaborations

Marandjian has collaborated with notable colleagues such as Yervant D Lepejian and Hovhannes Ghukasyan. Their combined efforts contribute to advancing the technology in integrated circuit testing.

Conclusion

Hrant Marandjian's contributions to integrated circuit testing through his patents and work at Credence Systems Corporation highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of embedded memory testing.

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