Derwood, MD, United States of America

Howard P Layer

This inventor holds 1 USPTO granted patent. Top assignees: Frazier Precision Instrument Company, Inc., Holometrics, Inc.. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Howard P Layer. Retrieved from https://idiyas.com/inventor/howard-p-layer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: Howard P Layer: Innovator in Load Cell Technology

Introduction

Howard P Layer is a notable inventor based in Derwood, MD (US). He has made significant contributions to the field of measurement technology, particularly in load cell mass comparators. His innovative approach has led to advancements that enhance the accuracy and reliability of measurement systems.

Latest Patents

Howard P Layer holds a patent for a "Measurement circuit for load cell mass comparator." This invention modifies the strain gauge bridge circuit located in the load cell to provide temperature stability. By coupling a remotely located temperature compensating circuit between the two normally connected output ends of strain gauges in adjacent arms of the bridge, the invention ensures improved performance. The compensating circuit consists of a pair of series-connected low noise, drift-free precision resistors, which are shunted by high-valued potentiometers for balancing the bridge effectively.

Career Highlights

Throughout his career, Howard has worked with various companies, including Frazier Precision Instrument Company, Inc. and Holometrics, Inc. His experience in these organizations has allowed him to refine his skills and contribute to the development of innovative measurement solutions.

Collaborations

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Conclusion

Howard P Layer's contributions to load cell technology exemplify the impact of innovation in measurement systems. His patent reflects a commitment to enhancing accuracy and stability in engineering applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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