Haining, China

Houkun Tan

This inventor holds 1 USPTO granted patent. Top assignee: Altenergy Power System, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Houkun Tan. Retrieved from https://idiyas.com/inventor/houkun-tan

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Houkun Tan and Rapid Shutdown Safety Technology.

Introduction

Houkun Tan is an inventor based in Haining, China, whose patent work addresses the testing and control of rapid shutdown devices. His invention focuses on improving the efficiency and safety of systems that use these devices.

Latest Patents

Tan is associated with 1 patent: “Shutdown Device Detection and Control Method, and Detector.” The patent describes a method and tester for checking and controlling a rapid shutdown device. When a testing request is received, the tester sends a lower-strength heartbeat signal to switch on a target device and runs a preset testing program. When a control request is received, it sends a higher-strength heartbeat signal to switch devices in the module on or off. The approach is intended to make testing and control more efficient, reduce safety hazards, and help protect workers.

Career Highlights

Tan’s listed patent is connected to Altenergy Power System, Inc. It reflects work on practical safety measures for rapid shutdown systems.

Collaborations

Yuhao Luo and Xuan Zhu are identified as Tan’s coworkers. Their names are provided as professional associations, though specific roles in the patent are not stated.

Conclusion

Houkun Tan’s patent centers on a signal-based method for testing and controlling rapid shutdown devices, with the goal of improving operational efficiency and worker safety.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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