Shizuoka, Japan

Hosu Yeu

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Canon Kabushiki Kaisha. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hosu Yeu. Retrieved from https://idiyas.com/inventor/hosu-yeu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hosu Yeu and an Image-Forming Apparatus Patent.

Introduction

Hosu Yeu is an inventor associated with Canon Kabushiki Kaisha and based in Shizuoka, Japan. His patent work includes an image-forming apparatus designed to detect cartridge attachment status using electrical measurements.

Latest Patents

The provided information lists one patent for Yeu: “Image forming apparatus.” The invention includes an image-bearing member, a charging member, cartridges, and an exposure unit whose light-emitting portion switches off when the second cartridge is detached. A current-detecting portion measures the charge current, while a potential-changing portion adjusts the image-bearing member’s surface potential. The apparatus uses the detected current to determine whether the first and second cartridges are attached.

Career Highlights

Yeu’s listed patent reflects work on printer and imaging technology, particularly cartridge detection and control of the image-forming process. The supplied data identifies 1 patent associated with him.

Collaborations

The patent is associated with Canon Kabushiki Kaisha, a company working in imaging and related technologies. The available information does not specify additional collaborators.

Conclusion

Hosu Yeu’s listed invention addresses cartridge-status detection in an image-forming apparatus, contributing to Canon Kabushiki Kaisha’s patent work in imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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