Los Angeles, CA, United States of America

Hoshyar R Sayah

This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the Administrator of the. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hoshyar R Sayah. Retrieved from https://idiyas.com/inventor/hoshyar-r-sayah

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Hoshyar R Sayah: Innovator in Integrated Circuit Reliability Testing

Introduction

Hoshyar R Sayah, an inventor based in Los Angeles, California, has made significant contributions to the field of integrated circuit technology. With a keen focus on reliability testing, Sayah's innovative techniques enhance the performance and durability of microscopic conductors used in integrated circuits.

Latest Patents

Sayah holds a patent for his groundbreaking invention titled "Integrated Circuit Reliability Testing." This technique is designed to determine the reliability of microscopic conductors deposited on uneven surfaces of integrated circuit devices. The patent outlines a method where a wafer with integrated circuit chips includes a test area comprising regions of different heights. When conductors are applied to various chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area, traversing multiple height steps. This design allows for the measurement of resistance variations indicative of reliability issues, thereby informing decisions on whether to discard specific integrated circuits based on their required reliability.

Career Highlights

Hoshyar R Sayah's career is highlighted by his work with the United States of America as represented by the Administrator of the National Aeronautics and Space Administration (NASA). Sayah's dedication to advancing technology in integrated circuits is evident through his innovative research and successful patent application, showcasing his expertise in the field.

Collaborations

In his professional journey, Sayah has had the opportunity to collaborate with fellow inventor Martin G Buehler. Together, they contribute to the ongoing development and refinement of technologies that have practical implications in electronic device reliability.

Conclusion

Hoshyar R Sayah stands as a notable figure in the realm of integrated circuit reliability testing. His patented technique not only represents a significant advancement in technology but also demonstrates his commitment to enhancing the performance and reliability of electronic devices. As the industry continues to evolve, contributions from inventors like Sayah play a crucial role in shaping the future of integrated circuit technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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