This inventor holds 1 USPTO granted patent. Top assignee: The United States of America as Represented by the Administrator of the. Active years: 1990.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990
Title: Hoshyar R Sayah: Innovator in Integrated Circuit Reliability Testing
Introduction
Hoshyar R Sayah, an inventor based in Los Angeles, California, has made significant contributions to the field of integrated circuit technology. With a keen focus on reliability testing, Sayah's innovative techniques enhance the performance and durability of microscopic conductors used in integrated circuits.
Latest Patents
Sayah holds a patent for his groundbreaking invention titled "Integrated Circuit Reliability Testing." This technique is designed to determine the reliability of microscopic conductors deposited on uneven surfaces of integrated circuit devices. The patent outlines a method where a wafer with integrated circuit chips includes a test area comprising regions of different heights. When conductors are applied to various chip areas of the wafer, an elongated serpentine assay conductor is deposited on the test area, traversing multiple height steps. This design allows for the measurement of resistance variations indicative of reliability issues, thereby informing decisions on whether to discard specific integrated circuits based on their required reliability.
Career Highlights
Hoshyar R Sayah's career is highlighted by his work with the United States of America as represented by the Administrator of the National Aeronautics and Space Administration (NASA). Sayah's dedication to advancing technology in integrated circuits is evident through his innovative research and successful patent application, showcasing his expertise in the field.
Collaborations
In his professional journey, Sayah has had the opportunity to collaborate with fellow inventor Martin G Buehler. Together, they contribute to the ongoing development and refinement of technologies that have practical implications in electronic device reliability.
Conclusion
Hoshyar R Sayah stands as a notable figure in the realm of integrated circuit reliability testing. His patented technique not only represents a significant advancement in technology but also demonstrates his commitment to enhancing the performance and reliability of electronic devices. As the industry continues to evolve, contributions from inventors like Sayah play a crucial role in shaping the future of integrated circuit technologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
