Witten, Germany

Horst Ruter

This inventor holds 1 USPTO granted patent. Top assignee: Bergwerksverband Gmbh. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Horst Ruter. Retrieved from https://idiyas.com/inventor/horst-ruter

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 21(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: The Innovations of Horst Ruter

Introduction

Horst Ruter is a notable inventor based in Witten, Germany. He has made significant contributions to the field of electromagnetic measurements. His work has led to the development of innovative methods that enhance the processing of transient electromagnetic data.

Latest Patents

Horst Ruter holds a patent for a "Method of processing transient electromagnetic measurements." This patent showcases his expertise and commitment to advancing technology in his field. He has 1 patent to his name, reflecting his innovative spirit.

Career Highlights

Ruter is currently employed at Bergwerksverband GmbH, where he applies his knowledge and skills to further the company's objectives. His role at the company allows him to work on cutting-edge projects that contribute to the advancement of electromagnetic measurement techniques.

Collaborations

One of his notable coworkers is Kurt-Martin Strack. Together, they collaborate on various projects that aim to push the boundaries of their field. Their partnership exemplifies the importance of teamwork in driving innovation.

Conclusion

Horst Ruter's contributions to the field of electromagnetic measurements are commendable. His patent and work at Bergwerksverband GmbH highlight his dedication to innovation. Through collaboration with colleagues like Kurt-Martin Strack, he continues to make strides in his area of expertise.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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