Nauborn, Germany

Horst Hartmann

This inventor holds 1 USPTO granted patent. Top assignee: Ernst Leitz G.m.b.h.. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Horst Hartmann. Retrieved from https://idiyas.com/inventor/horst-hartmann-djwi012a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 1977

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1 patent (USPTO):Explore Patents

Title: Horst Hartmann: Innovator in Optical Systems

Introduction

Horst Hartmann is a notable inventor based in Nauborn, Germany. He has made significant contributions to the field of optical systems, particularly in the area of automatic focusing mechanisms. His innovative approach has paved the way for advancements in microscopy and other optical applications.

Latest Patents

Horst Hartmann holds a patent for a "Method and apparatus for automatically focusing an optical system, particularly a microscope." This invention features a grating located in the intermediate image plane that acts as a spatial frequency filter. A photoelectric detection system is associated with the grating, generating electrical control signals modulated by the relative motion between the object image and the grating. The design allows for precise focusing, enhancing the functionality of optical systems.

Career Highlights

Throughout his career, Hartmann has been associated with Ernst Leitz GmbH, a company renowned for its contributions to optical technology. His work has been instrumental in developing advanced optical instruments that are widely used in scientific research and medical applications.

Collaborations

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Conclusion

Horst Hartmann's innovative work in optical systems exemplifies the impact of dedicated inventors in advancing technology. His contributions continue to influence the field of microscopy and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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