Nagoya, Japan

Horoshi Nakajima

This inventor holds 1 USPTO granted patent. Top assignee: Ngk Insulators, Inc.. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Horoshi Nakajima. Retrieved from https://idiyas.com/inventor/horoshi-nakajima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: Horoshi Nakajima: Innovator in Thermal Flow Measurement

Introduction

Horoshi Nakajima is a notable inventor based in Nagoya, Japan. He has made significant contributions to the field of thermal flow measurement technology. His innovative work has led to the development of a unique resistor designed for thermal type flowmeters.

Latest Patents

One of Nakajima's key patents is for resistors used in thermal flowmeters. This patent describes a resistor that includes a ceramic substrate, a thin platinum film formed on the surface of the ceramic substrate, and lead wires for connecting the thin platinum film with an external circuit. This resistor is specifically designed to be located in a fluid to detect its flow rate. Nakajima holds 1 patent related to this technology.

Career Highlights

Horoshi Nakajima is currently employed at NGK Insulators, Inc., where he continues to innovate in the field of thermal measurement. His work has been instrumental in advancing the technology used in flow measurement devices.

Collaborations

Throughout his career, Nakajima has collaborated with talented individuals such as Yasuhito Yajima and Fujio Ishiguro. These collaborations have contributed to the development of cutting-edge technologies in their respective fields.

Conclusion

Horoshi Nakajima's contributions to thermal flow measurement technology exemplify the impact of innovative thinking in engineering. His work continues to influence the industry and improve measurement accuracy in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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