Gyeonggi-do, South Korea

Hoonsik Cho

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hoonsik Cho. Retrieved from https://idiyas.com/inventor/hoonsik-cho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Hoonsik Cho - Innovator in Measuring Technology

Introduction

Hoonsik Cho is a notable inventor based in Gyeonggi-do, South Korea. He has made significant contributions to the field of measuring technology, particularly through his innovative patent. His work is recognized within the industry, and he is associated with a leading technology company.

Latest Patents

Hoonsik Cho holds a patent for a measuring device and method. This device includes a housing with an opening for carrying a substrate. It features a first sensor that emits light to the substrate and detects the reflected light. Additionally, a second sensor emits light that is blocked by the substrate. The controller calculates both vertical and horizontal displacements of the substrate, allowing for precise measurements and error calculations.

Career Highlights

Hoonsik Cho is currently employed at Samsung Electronics Co., Ltd., a global leader in technology and innovation. His role at the company allows him to work on cutting-edge projects that push the boundaries of measuring technology. His patent reflects his expertise and commitment to advancing the field.

Collaborations

He has collaborated with talented coworkers, including Heonyoung Lim and Seung-Joon Lee. These partnerships have contributed to the development of innovative solutions in their projects.

Conclusion

Hoonsik Cho is a prominent inventor whose work in measuring technology has made a significant impact. His patent showcases his innovative approach and dedication to precision in measurement. His contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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