Ewing, NJ, United States of America

Hoonghai Zhang

This inventor holds 1 USPTO granted patent. Top assignee: Nec Laboratories America, Inc.. Active years: 2012.


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hoonghai Zhang

Introduction

Hoonghai Zhang is a notable inventor based in Ewing, NJ (US). He has made significant contributions to the field of wireless communication technology. His work focuses on improving the efficiency and performance of wireless data networks.

Latest Patents

Hoonghai Zhang holds 1 patent for his invention titled "Distributed inter-cell interference mitigation in OFDMA multi-carrier wireless data networks." This patent discloses systems and methods for transmission with multiple base stations (BSs) in a wireless cellular data network. The invention allows one BS to communicate with neighboring BSs by determining a binary or discrete new power level on each subchannel. This process helps in determining a weighted sum modified rates of a BS and its neighboring BSs, while also resolving concurrent power updates in each BS in a distributed manner.

Career Highlights

Hoonghai Zhang is currently employed at NEC Laboratories America, Inc. His work at this esteemed organization has allowed him to explore innovative solutions in wireless communication. His expertise in the field has positioned him as a valuable asset to his team.

Collaborations

Throughout his career, Hoonghai Zhang has collaborated with talented individuals such as Sampath Rangarajan and Luca Venturino. These collaborations have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Hoonghai Zhang's contributions to wireless communication technology exemplify the impact of innovative thinking in solving complex problems. His patent and collaborations highlight his commitment to advancing the field.

Profile summary based on public USPTO records.
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