Daejeon, South Korea

Hoon Kim

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignees: Korea Advanced Institute of Science and Technology, Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hoon Kim. Retrieved from https://idiyas.com/inventor/hoon-kim-ziasrxir

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hoon Kim: Inventor of a Precision Test Apparatus

Introduction

Hoon Kim is an inventor associated with Daejeon, South Korea. His patent work includes a test apparatus and method designed to support precise profiling and milling of samples.

Latest Patents

The provided information lists one patent for Hoon Kim: “Test Apparatus and Test Method Thereof.” The invention describes a movable stage that supports a sample and differently shaped tips that alternately profile and mill it. A position sensor measures the relationship between the tips and the sample, while controllers coordinate stage movement, select tips, and set milling conditions. The milling depth is controlled using the relationship between the distance between the tips and sample and the force between them.

Career Highlights

Kim’s listed professional affiliations include Samsung Electronics and the Korea Advanced Institute of Science and Technology. His patent reflects work on apparatus and control methods for sample testing and processing.

Collaborations

The provided information names Sungyoon Ryu and Seungbum Hong as Kim’s coworkers.

Conclusion

Hoon Kim’s listed invention combines positioning, sensing, and controlled milling in a test apparatus, highlighting his contribution to precision sample processing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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