Seoul, South Korea

Hongzhe Li

This inventor holds 1 USPTO granted patent. Top assignee: Korea University Research and Business Foundation. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hongzhe Li. Retrieved from https://idiyas.com/inventor/hongzhe-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Innovations of Hongzhe Li in Software Vulnerability Analysis

Introduction: Hongzhe Li is an accomplished inventor based in Seoul, South Korea. He has made significant contributions to the field of software security, particularly in the area of vulnerability analysis. His innovative approach addresses critical issues in software development and security.

Latest Patents: Hongzhe Li holds a patent for a "Software vulnerability analysis method and device." This patent outlines a comprehensive process that includes searching for code clones corresponding to used source code, detecting security sinks and sensitive data, and verifying vulnerabilities through concolic testing. His work is pivotal in enhancing the security of software applications.

Career Highlights: Hongzhe Li is associated with the Korea University Research and Business Foundation, where he applies his expertise in software security. His role involves not only research but also the practical application of his inventions in real-world scenarios.

Collaborations: He has collaborated with notable colleagues, including Heejo Lee and Jonghoon Kwon, contributing to advancements in their shared field of expertise.

Conclusion: Hongzhe Li's innovative work in software vulnerability analysis exemplifies the importance of addressing security challenges in technology. His contributions are vital for the ongoing development of secure software solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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