Dongguan, China

Hongfei Hu

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Huawei Technologies Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hongfei Hu. Retrieved from https://idiyas.com/inventor/hongfei-hu-yod0p2p0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Hongfei Hu and Optical Network Fault Localization.

Introduction

Hongfei Hu is an inventor based in Dongguan, China, associated with Huawei Technologies Co., Ltd. His patent work addresses fault localization in optical networks, with a focus on making diagnosis more accurate and efficient.

Latest Patents

Hu is associated with 1 patent: “Fault Locating Method for Optical Network and Related Device.” The invention describes a network management device that collects a series of optical-power measurements from an optical network device during a fault-localization period. At least one measurement is at or below a specified threshold. By analyzing the measurements’ changing trend, the network management device determines the type of fault. The approach is intended to reduce the complexity of fault localization while improving its accuracy and efficiency.

Career Highlights

The available information identifies Hu’s work with Huawei Technologies Co., Ltd. and highlights his contribution to optical-network fault diagnosis through the described patent.

Collaborations

Hu’s listed coworker is Yangjun Wan. The patent’s described method involves coordination between a network management device and an optical network device to analyze optical-power measurements.

Conclusion

Hongfei Hu’s patent focuses on using optical-power trends to identify network faults, offering a method designed to simplify diagnosis and improve fault-localization performance.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…