Dongguan, China

Hongda Weng

This inventor holds 1 USPTO granted patent. Top assignee: Huawei Technologies Co., Limited. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hongda Weng. Retrieved from https://idiyas.com/inventor/hongda-weng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hongda Weng: Inventor of a Voltage Sampling Apparatus

Introduction

Hongda Weng is an inventor associated with Dongguan, China, and Huawei Technologies Co., Ltd. His patent work includes a voltage-sampling design intended to support signal measurement and calibration.

Latest Patents

Weng is associated with 1 patent: “Voltage Sampling Apparatus and Related Method.” The invention includes a differential circuit, a voltage division circuit, and a calibration switch. When the switch is on, the differential circuit supplies a target signal to two voltage-division branches connected in parallel. The arrangement links the differential circuit’s two output ends to the respective branch inputs through the calibration switch.

Career Highlights

Weng’s listed patent reflects work on electronic circuitry for voltage sampling and calibration. His association with Huawei Technologies Co., Ltd. connects this invention to the company’s broader technology and engineering activities.

Collaborations

Weng’s listed coworkers include Wenguang Li and Baoguo Chen. Their shared association indicates a professional connection in the context of the patent information provided.

Conclusion

Hongda Weng’s patent focuses on a switched differential-circuit arrangement for sampling and calibrating voltage signals, highlighting his contribution to electronic measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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