Hongche Noh

Title: Innovations by Hongche Noh in Semiconductor Technology

Introduction

Hongche Noh is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of semiconductor technology, particularly through his innovative patent related to semiconductor inspection.

Latest Patents

Hongche Noh holds a patent for a "Semiconductor inspection apparatus and semiconductor inspection method using the same." This invention discloses semiconductor inspection apparatuses and methods that enhance the efficiency of semiconductor device evaluation. The apparatus comprises a stage that supports a semiconductor device, a first column that irradiates a first electron beam toward the semiconductor device, a second column that irradiates a second electron beam toward the semiconductor device, and a detector that detects a secondary electron generated by the second electron beam. Notably, the first column is disposed to make a first angle with the top surface of the semiconductor device, while the second column is positioned to make a different second angle with the same surface.

Career Highlights

Hongche Noh is currently employed at Samsung Electronics Co., Ltd., where he continues to push the boundaries of semiconductor technology. His work has been instrumental in advancing inspection methods that are crucial for the production of high-quality semiconductor devices.

Collaborations

Some of his notable coworkers include Yujin Cho and Jonghyuk Kang, who collaborate with him on various projects within the semiconductor field.

Conclusion

Hongche Noh's contributions to semiconductor inspection technology exemplify the innovative spirit that drives advancements in the electronics industry. His patent reflects a commitment to improving the efficiency and accuracy of semiconductor evaluations, which is vital for the ongoing development of electronic devices.