Charlotte, NC, United States of America

Hong Lei Jiang

This inventor holds 1 USPTO granted patent. Top assignee: Honeywell International Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hong Lei Jiang. Retrieved from https://idiyas.com/inventor/hong-lei-jiang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hong Lei Jiang and Elevator Positioning Innovation.

Introduction

Hong Lei Jiang is an inventor associated with Charlotte, North Carolina, and Honeywell International Inc. His patent work includes a system designed to estimate an elevator car’s position within an elevator shaft by analyzing frequency-spectrum data.

Latest Patents

Jiang is credited with 1 patent: “Elevator Positioning System with Frequency Spectrum Footprinting.” The invention describes collecting reference frequency-spectrum data at multiple positions along an elevator shaft and creating a footprint for each position based partly on frequency peaks. The system then compares real-time spectrum data from an elevator car with those reference footprints to estimate the car’s location.

Career Highlights

The patent reflects an approach to elevator positioning that uses signal characteristics associated with known locations. By matching live measurements against stored reference data, the system can estimate position without relying solely on conventional position indicators.

Collaborations

The provided information identifies En Yi Chen and Yang Lu as Jiang’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.

Conclusion

Hong Lei Jiang’s patent presents a frequency-spectrum footprinting method for estimating elevator-car position, connecting his inventive work with Honeywell International Inc. and the field of elevator systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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