Hong-Jie Chen

Title: Innovations of Hong-Jie Chen

Introduction

Hong-Jie Chen is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of data testing and optimization. With a total of two patents to his name, Chen's work focuses on enhancing the efficiency of automatic test systems.

Latest Patents

One of his latest patents is a method of high-speed data rate testing. This innovative method optimizes a data strobe for a multiple circuit, automatic test system. The process begins by probing, in parallel, a circuit group that consists of multiple circuits. A data strobe of the automatic test system is then initialized to a strobe set point relative to a system clock cycle. Each circuit's function is partially tested in parallel using the strobe set point. The circuit yield from this partial testing is logged, and the data strobe is updated to a new strobe set point. These steps of testing, logging, and updating are repeated until a specified range of strobe set points is completed. Ultimately, the data strobe is set for the circuit group to the strobe set point associated with the highest circuit yield.

Career Highlights

Hong-Jie Chen is currently employed at Etron Technology, Inc., where he continues to develop innovative solutions in the field of electronics. His expertise in data testing has positioned him as a valuable asset to the company.

Collaborations

Some of his notable coworkers include Tah-Kang Joseph Ting and Shih-Hsing Wang. Their collaborative efforts contribute to the advancement of technology within their field.

Conclusion

Hong-Jie Chen's contributions to the field of data testing and optimization reflect his dedication to innovation. His patents demonstrate a commitment to improving automatic test systems, making significant strides in technology.