Shenzhen, China

Hong-Hong Jia

This inventor holds 1 USPTO granted patent. Top assignee: Hon Hai Precision Industry Co., Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hong-Hong Jia. Retrieved from https://idiyas.com/inventor/hong-hong-jia

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hong-Hong Jia

Introduction

Hong-Hong Jia is a notable inventor based in Shenzhen, China. He has made significant contributions to the field of technology, particularly in the area of measurement devices. His innovative work has led to the development of a unique patent that showcases his expertise and creativity.

Latest Patents

Hong-Hong Jia holds a patent for a dimension measuring apparatus with image capabilities. This invention reflects his commitment to advancing measurement technology and improving accuracy in various applications. He has 1 patent to his name, which highlights his innovative contributions to the industry.

Career Highlights

Jia is currently employed at Hon Hai Precision Industry Co., Ltd., a leading technology company known for its manufacturing and design capabilities. His role at the company allows him to work on cutting-edge projects that push the boundaries of technology and innovation.

Collaborations

Throughout his career, Hong-Hong Jia has collaborated with talented individuals such as Sheng-Qiang Shen and Chih-Kuang Chang. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.

Conclusion

Hong-Hong Jia's contributions to the field of measurement technology are commendable. His innovative spirit and collaborative efforts continue to inspire advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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