Shanghai, China

Hong Han

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ohaus Instruments (Shanghai) Co., Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hong Han. Retrieved from https://idiyas.com/inventor/hong-han

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: The Innovations of Hong Han

Introduction

Hong Han is a notable inventor based in Shanghai, China. He has made significant contributions to the field of laboratory analysis. His work is recognized for its impact on the efficiency and accuracy of laboratory instruments.

Latest Patents

Hong Han holds a patent for a laboratory analyzer. This invention showcases his commitment to advancing technology in laboratory settings. The patent reflects his innovative approach to solving complex problems in the field.

Career Highlights

Hong Han is currently employed at Ohaus Instruments (Shanghai) Co., Ltd. His role at the company allows him to apply his expertise in developing cutting-edge laboratory equipment. His contributions have been instrumental in enhancing the company's product offerings.

Collaborations

Hong Han collaborates with his coworker, Xun Zhu, to further innovate in their field. Together, they work on projects that aim to improve laboratory processes and technologies.

Conclusion

Hong Han's work as an inventor and his patent for a laboratory analyzer highlight his dedication to innovation in laboratory technology. His contributions continue to shape the future of laboratory analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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