Xi'an, China

Hong Chang

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Chinese Academy of Sciences, Hefei National Laboratory. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hong Chang. Retrieved from https://idiyas.com/inventor/hong-chang-4dklatt0

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Innovations of Hong Chang in Optical Lattice Atomic Clocks

Introduction

Hong Chang is a notable inventor based in Xi'an, China. He has made significant contributions to the field of optical lattice atomic clocks. His innovative work has led to the development of advanced technologies that enhance precision in timekeeping.

Latest Patents

Hong Chang holds a patent for a dual frequency laser designed for a dual mode optical lattice atomic clock. This invention includes a 532 nm pump laser source, a beam splitter set, a dichroic mirror, a titanium sapphire crystal, a birefringent crystal, an electro-optic crystal, a concave reflector, and a PZT. The design allows for the generation of two eigen modes within the same cavity, enhancing the functionality of atomic clocks.

Career Highlights

Throughout his career, Hong Chang has worked with prestigious institutions such as the Chinese Academy of Sciences and Hefei National Laboratory. His experience in these organizations has contributed to his expertise in optical technologies and laser applications.

Collaborations

Due to space constraints, the collaborations section will be omitted.

Conclusion

Hong Chang's innovative contributions to the field of optical lattice atomic clocks demonstrate his expertise and commitment to advancing technology. His work continues to influence the development of precision timekeeping systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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