Saarbrucken, Germany

Holger Pitsch

This inventor holds 1 USPTO granted patent. Top assignee: Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.v.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Holger Pitsch. Retrieved from https://idiyas.com/inventor/holger-pitsch-es3fnwqp

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Holger Pitsch: Innovator in Nondestructive Measurement Technology

Introduction

Holger Pitsch is a notable inventor based in Saarbrücken, Germany. He has made significant contributions to the field of nondestructive measurement technology. His work is particularly recognized for its innovative approach to measuring magnetic properties without causing damage to the materials being tested.

Latest Patents

Holger Pitsch holds a patent for a "Process and apparatus for the nondestructive measuring of magnetic." This invention showcases his expertise in developing methods that enhance measurement accuracy while preserving the integrity of the materials involved. He has 1 patent to his name, reflecting his commitment to advancing technology in this area.

Career Highlights

Pitsch is affiliated with the Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung E.V., a leading research organization in Germany. His role at this esteemed institution allows him to collaborate with other experts and contribute to groundbreaking research and development projects.

Collaborations

One of his notable collaborators is Gerd Dobmann. Together, they work on projects that push the boundaries of current technology and explore new applications for nondestructive measurement techniques.

Conclusion

Holger Pitsch is a distinguished inventor whose work in nondestructive measurement technology has made a significant impact in his field. His patent and collaboration with leading research institutions highlight his dedication to innovation and advancement in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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