Stanford, CA, United States of America

HoJoon Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Leland Stanford Junior University. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: HoJoon Lee. Retrieved from https://idiyas.com/inventor/hojoon-lee-5sqe68ul

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Innovations of HoJoon Lee in Genomic Analysis

Introduction

HoJoon Lee is an accomplished inventor based in Stanford, CA. He has made significant contributions to the field of genomic analysis, particularly in the study of short tandem repeats (STRs). His innovative methods have the potential to enhance the accuracy and efficiency of genetic research.

Latest Patents

HoJoon Lee holds a patent for a method titled "High resolution STR analysis using next generation sequencing." This method involves analyzing short tandem repeats by digesting genomic samples, fragmenting the products, and selectively amplifying strands for sequencing. The process allows for precise counting of STR repeats, which is crucial for various genetic applications. He has 1 patent to his name.

Career Highlights

HoJoon Lee is affiliated with Leland Stanford Junior University, where he conducts research and develops innovative techniques in genomics. His work has garnered attention for its potential applications in medical research and diagnostics.

Collaborations

He has collaborated with notable colleagues, including Hanlee P Ji and Billy Tsz Cheong Lau, to advance research in genomic technologies.

Conclusion

HoJoon Lee's contributions to genomic analysis through his patented methods exemplify the impact of innovation in the field of genetics. His work continues to pave the way for advancements in understanding genetic variations and their implications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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