This inventor holds 1 USPTO granted patent. Top assignee: Wisconsin Alumni Research Foundation. Active years: 2010.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010
Title: The Innovations of Ho Young Lee
Introduction
Ho Young Lee is an accomplished inventor based in Madison, WI (US). He has made significant contributions to the field of sensor technology, particularly in the development of solid-state capacitance sensors. His innovative work has led to the creation of a unique apparatus for measuring deformation in dielectric materials.
Latest Patents
One of Ho Young Lee's notable patents is for a dielectrostrictive sensor designed to measure deformation. This invention involves an apparatus and method that utilizes a solid-state capacitance sensor to assess strain forces on a dielectric. The sensor comprises at least one pair of electrostriction sensors, each equipped with two electrodes and a central axis. The central axes are arranged in a common plane and oriented substantially perpendicularly to one another. To enhance the analysis, at least two pairs of sensors are configured to form a rosette, enabling multi-component analysis of samples with dielectric properties under stress or strain.
Career Highlights
Ho Young Lee is associated with the Wisconsin Alumni Research Foundation, where he continues to advance his research and development efforts. His work has garnered attention for its practical applications in various industries, particularly those requiring precise measurements of material deformation.
Collaborations
Ho Young Lee has collaborated with esteemed colleagues, including Yuri Michael Shkel and Yiyan Peng. Their combined expertise has contributed to the advancement of sensor technologies and the exploration of new applications.
Conclusion
Ho Young Lee's innovative contributions to sensor technology exemplify the impact of dedicated research and collaboration in the field of inventions. His work continues to influence advancements in measuring deformation in dielectric materials.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
