Goyang, South Korea

Ho Joon Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ho Joon Lee. Retrieved from https://idiyas.com/inventor/ho-joon-lee-8pqm7g08

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ho Joon Lee: Innovator in Super Resolution Imaging

Introduction

Ho Joon Lee is a prominent inventor based in Goyang-si, South Korea. He has made significant contributions to the field of imaging technology, particularly through his innovative work on super resolution scanning electron microscopes.

Latest Patents

Ho Joon Lee holds a patent for a device and method related to super resolution SEM imaging. This patent describes a super resolution scanning electron microscope (SEM) image implementing device that includes a processor designed to crop low-resolution SEM images. The device generates first and second cropped images, upscales them to create first and second upscaled images, and cancels noise from these images to produce first and second noise-canceled images.

Career Highlights

Ho Joon Lee is currently employed at Samsung Electronics Co., Ltd., where he continues to push the boundaries of imaging technology. His work has been instrumental in enhancing the capabilities of electron microscopy, which is crucial for various scientific and industrial applications.

Collaborations

Throughout his career, Ho Joon Lee has collaborated with notable colleagues, including Il Gyu Kim and Sang Gul Park. These collaborations have fostered a productive environment for innovation and development in their respective fields.

Conclusion

Ho Joon Lee's contributions to super resolution imaging technology exemplify the impact of innovative thinking in advancing scientific research. His work at Samsung Electronics Co., Ltd. continues to influence the future of imaging technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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