The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2025

Filed:

Apr. 15, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Ho Joon Lee, Goyang-si, KR;

Il Kwon Kim, Hwaseong-si, KR;

Sang Gul Park, Hwaseong-si, KR;

Chang Wook Jeong, Hwaseong-si, KR;

Moon Hyun Cha, Yongin-si, KR;

Sat Byul Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 1/00 (2006.01); G06T 3/40 (2024.01); G06T 3/4053 (2024.01); G06T 5/00 (2024.01); G06T 5/20 (2006.01); G06T 5/70 (2024.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G06T 1/0007 (2013.01); G06T 3/4053 (2013.01); G06T 5/20 (2013.01); G06T 5/70 (2024.01); G06T 11/00 (2013.01); G06T 2207/10061 (2013.01); G06T 2207/30148 (2013.01);
Abstract

Some example embodiments relate to a super resolution scanning electron microscope (SEM) image implementing device and/or a method thereof. Provided a super resolution scanning electron microscope (SEM) image implementing device comprising a processor configured to crop a low resolution SEM image to generate a first cropped image and a second cropped image, to upscale the first cropped image and the second cropped image to generate a first upscaled image and a second upscaled image, and to cancel noise from the first upscaled image and the second upscaled image to generate a first noise canceled image and a second noise canceled image.


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