Ho Geun Park

Title: Innovation and Expertise of Inventor Ho Geun Park

Introduction:

Ho Geun Park is a distinguished inventor based in Seoul, South Korea. With a remarkable career, he has contributed to the field of technology and innovation through his inventive work. Holding two patents, he is known for developing advanced methods in the area of wafer defect detection.

Latest Patents:

One of his latest patents is titled "Method and apparatus for detecting defect pattern on wafer based on unsupervised learning." This invention showcases a unique clustering method that operates without the need for tagging training data. The approach is robust against noise and efficiently removes it using three-dimensional stacked spatial auto-correlation. By utilizing multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values as features, the method allows for the generation of effective clustering models. The implementation of this technique makes it adaptable to various challenges such as noise, rotation, and the presence of fine unusual shapes. Additionally, the invention enables the classification of clusters into multi-level categories, facilitating a stochastic automatic evaluation of both normal and defect clusters using only measurement data without any labeled input.

Career Highlights:

Ho Geun Park has made significant contributions to Samsung SDS Co., Ltd., where he applies his expertise in technology and innovation. His work emphasizes the intersection of artificial intelligence and practical applications in the semiconductor industry. With a passion for advancing methods in defect detection, his inventions have the potential to enhance manufacturing processes significantly.

Collaborations:

In his career, Ho Geun Park has collaborated with esteemed colleagues such as Min Sik Chu and Seong Mi Park. These partnerships have fostered an environment of innovation and excellence, contributing to the overall success of their projects within the company.

Conclusion:

Ho Geun Park's inventive spirit and technical knowledge continue to shape advancements in the field of wafer defect detection. His patented innovations reflect a commitment to developing cutting-edge solutions that address complex challenges. As a professional in a leading technology company, he exemplifies the role of inventors in driving innovation forward.