Singapore, Singapore

Hla Moe

This inventor holds 1 USPTO granted patent. Top assignee: Seagate Technology Incorporated. Active years: 2011.


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Hla Moe - Innovator in Data Integrity Management

Introduction

Hla Moe is a notable inventor based in Singapore, recognized for his contributions to data integrity management. His innovative work focuses on enhancing the reliability of data storage devices in the face of electrostatic events. With a single patent to his name, Hla Moe has made significant strides in the field of electronic device monitoring.

Latest Patents

Hla Moe's patent, titled "Data integrity management responsive to an electrostatic event," addresses the critical issue of detecting electrostatic charges at data storage devices. The patent outlines a method for monitoring electronic devices equipped with data storage mediums for potential electrostatic events. Upon detection of such an event, a data integrity management process can be selectively implemented to safeguard the stored data.

Career Highlights

Hla Moe is currently employed at Seagate Technology Incorporated, a leading company in data storage solutions. His role involves developing innovative technologies that enhance data integrity and reliability. His expertise in this area has positioned him as a valuable asset to his team and the broader field of data management.

Collaborations

Hla Moe collaborates with talented colleagues, including Pei Koh Lee and Lucas Kong Yaw Lee. These partnerships foster a creative environment that encourages the development of cutting-edge solutions in data integrity management.

Conclusion

Hla Moe's contributions to the field of data integrity management demonstrate his commitment to innovation and excellence. His work not only addresses current challenges in data storage but also paves the way for future advancements in technology.

Profile summary based on public USPTO records.
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