Taipei, Taiwan

Hiu-Ru Jiang

This inventor holds 1 USPTO granted patent. Top assignee: National Yang Ming Chiao Tung University. Active years: 2014.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Hiu-Ru Jiang: Innovator in Engineering Change Order Methods

Introduction

Hiu-Ru Jiang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of engineering, particularly in the area of design optimization. His innovative approach has led to the development of a unique method that addresses critical challenges in engineering change orders.

Latest Patents

Hiu-Ru Jiang holds a patent for an "Engineering change order hold time fixing method." This method fulfills a short path padding in a placed and routed design by minimizing capacitance insertion. The process involves a padding value determination step that utilizes a cell library, timing constraints, and a timing analysis report to ascertain the necessary padding values and locations for each gate in the design. Additionally, a load/buffer allocation step leverages spare cell information and dummy metal information to achieve the desired short path padding.

Career Highlights

Hiu-Ru Jiang is affiliated with National Yang Ming Chiao Tung University, where he contributes to research and development in engineering. His work is characterized by a commitment to enhancing design methodologies and improving efficiency in engineering processes.

Collaborations

Hiu-Ru Jiang collaborates with esteemed colleagues, including Yu-Ming Yang and Sung-Ting Ho. Their collective expertise fosters an environment of innovation and advancement in engineering practices.

Conclusion

Hiu-Ru Jiang's contributions to engineering through his patented methods exemplify the impact of innovative thinking in design optimization. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
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