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For the Inventor, By the Inventor

Hyogo, Japan

Hitoshi Tanaka

This inventor holds 7 USPTO granted patents. Top assignee: Mitsubishi Denki Kabushiki Kaisha. Active years: 1986-1996.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hitoshi Tanaka. Retrieved from https://idiyas.com/inventor/hitoshi-tanaka-jn26ojx2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 7

% Patents Active = 100.0

Average Co-Inventor Count = 2.9

ph-index = 5

Forward Citations = 74(Granted Patents)


Location History:

  • Aichi, JP (1986)
  • Amagasaki, JP (1992)
  • Hyogo, JP (1990 - 1996)

Company Filing History:

goldMedal7 out of 21,351 
 
Mitsubishi Denki Kabushiki Kaisha
 patents

Years Active: 1986-1996

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7 patents (USPTO):Explore Patents
1. 5481095 - Code reading pattern and an image pickup apparatus for reading the (1996-01-02),
2. 5379150 - Method of manufacturing a spatial frequency filter for use in a pattern (1995-01-03),
3. 5289260 - Pattern defect detection device and a spatial frequency filter used (1994-02-22),
4. 5170063 - Inspection device for detecting defects in a periodic pattern on a (1992-12-08),
5. 5008558 - System for detecting minute particles on or above a substrate (1991-04-16),
6. 4929081 - System for detecting defects in a regularly arranged pattern such as an (1990-05-29),
7. 4591989 - System for displaying tool parameters of tools utilized in a machining (1986-05-27),

Title: Hitoshi Tanaka: Innovator in Code Reading Technology

Introduction

Hitoshi Tanaka is a prominent inventor based in Hyogo, Japan. He has made significant contributions to the field of code reading technology, holding a total of 7 patents. His innovative work has paved the way for advancements in image pickup apparatuses and spatial frequency filters.

Latest Patents

Tanaka's latest patents include a code reading pattern and an image pickup apparatus designed for reading symbols that represent significant information. The code reading pattern is formed by repeated markings of constant pitch on the surface of an object. These markings define an area with at least one boundary, which outlines the symbol. The apparatus features a lighting system that illuminates the code reading pattern with parallel light, an imaging system that captures light reflected from the pattern, and a spatial frequency filtering system. This filtering system is strategically located at the near back focal plane of the imaging system to block regular reflected light while transmitting diffracted light to project an image of the symbol. Additionally, he has developed a method for manufacturing a spatial frequency filter used in pattern defect detection devices, which includes a pattern with a black spot that has a controlled diameter expansion compared to a black spot on a photosensitive plate.

Career Highlights

Hitoshi Tanaka is currently employed at Mitsubishi Electric Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in enhancing the efficiency and accuracy of code reading systems.

Collaborations

Tanaka has collaborated with notable coworkers, including Toshimasa Tomoda and Nobuyuki Kosaka, contributing to various projects that have furthered their collective expertise in the field.

Conclusion

Hitoshi Tanaka's contributions to code reading technology and his innovative patents highlight his role as a key figure in the advancement of this field. His work continues to influence the development of efficient imaging systems and spatial frequency filters.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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