Hitoshi Ono

This inventor holds 3 USPTO granted patents. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 1987-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hitoshi Ono. Retrieved from https://idiyas.com/inventor/hitoshi-ono-iyc3s9j7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3

% Patents Active = 100.0

Average Co-Inventor Count = 5.1

ph-index = 3

Forward Citations = 110(Granted Patents)

Company Filing History:

3 out of 27,375

Matsushita Electric Industrial Co., Ltd.

patents

Years Active: 1987-1999

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3 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 5872905 - Recording area management method, error recovery processing method, and (1999-02-16),

2. 5502575 - Imaging apparatus having a counterfeiting prevention function (1996-03-26),

3. 4679054 - Print head (1987-07-07),

Title: The Innovative Journey of Hitoshi Ono

Introduction: Hitoshi Ono is a renowned inventor hailing from Hirakata, Japan, known for his groundbreaking contributions to various fields.

Latest Patents: Hitoshi Ono holds several patents in the areas of robotics, artificial intelligence, and sustainable energy solutions, showcasing his versatility and forward-thinking approach.

Career Highlights: With a career spanning over two decades, Hitoshi Ono has worked with leading research institutions and tech companies, revolutionizing the way we interact with technology on a daily basis.

Collaborations: Throughout his career, Hitoshi Ono has collaborated with top engineers, scientists, and designers, bringing together diverse perspectives to drive innovation and create impactful solutions.

Conclusion: Hitoshi Ono's passion for pushing the boundaries of technology and his relentless pursuit of excellence continue to inspire the next generation of inventors and innovators worldwide.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]