This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2003.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2003
Title: Hitoshi Muguruma: Innovator in Surface Plasmon Resonance Technology
Introduction
Hitoshi Muguruma is a notable inventor based in Kochi-ken, Japan. He has made significant contributions to the field of biosensors, particularly through his innovative work on measuring chips for surface plasmon resonance sensors. His inventions aim to enhance the sensitivity and accuracy of detecting target substances.
Latest Patents
Hitoshi Muguruma holds a patent for a measuring chip designed for surface plasmon resonance biosensors. The patent, titled "Measuring chip for surface plasmon resonance biosensor and method for producing the same," focuses on providing a solution that allows for the detection of small amounts of target substances with high sensitivity. The invention features a metal layer, one or more plasma polymerization layers formed on the metal layer, and a biologically active substance immobilized on the surface of the plasma polymerization layer.
Career Highlights
Throughout his career, Hitoshi Muguruma has demonstrated a commitment to advancing biosensor technology. His innovative approach has led to the development of a unique measuring chip that addresses the challenges faced in detecting low concentrations of target substances. This advancement is crucial for various applications in medical diagnostics and environmental monitoring.
Collaborations
Hitoshi Muguruma has worked alongside talented individuals such as Runa Nakamura and Hiroyuki Nakamura. Their collaborative efforts have contributed to the successful development of his patented technology.
Conclusion
Hitoshi Muguruma's work in the field of surface plasmon resonance biosensors exemplifies the impact of innovation in technology. His contributions are paving the way for more sensitive and effective detection methods in various scientific fields.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile