Neyagawa, Japan

Hitoshi Kawai

This inventor holds 1 USPTO granted patent. Top assignee: Nippon Paint Compnay, Ltd.. Active years: 1993.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hitoshi Kawai. Retrieved from https://idiyas.com/inventor/hitoshi-kawai-13wx7ulx

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1993

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1 patent (USPTO):Explore Patents

Title: Hitoshi Kawai: Innovator in Electrodeposition Paint Measurement

Introduction

Hitoshi Kawai is a notable inventor based in Neyagawa, Japan. He has made significant contributions to the field of electrodeposition paint measurement. His innovative approach has led to the development of a unique method that enhances the accuracy of measuring nonvolatile contents in paints.

Latest Patents

Hitoshi Kawai holds a patent for a method that measures the concentration of nonvolatile contents in electrodeposition paint. This method involves irradiating the paint with ultrasonic waves while maintaining specific pH, temperature, and organic solvent concentration ranges. The damping factor is then measured, allowing for a prompt and accurate determination of the nonvolatile contents.

Career Highlights

Kawai is associated with Nippon Paint Company, Ltd., where he applies his expertise in paint technology. His work has been instrumental in advancing the methods used in the industry for quality control and product development.

Collaborations

Hitoshi Kawai has collaborated with notable colleagues such as Tomoyuki Irie and Ikuo Tochizawa. Their combined efforts have contributed to the innovative advancements in the field of paint technology.

Conclusion

Hitoshi Kawai's contributions to the measurement of nonvolatile contents in electrodeposition paint exemplify his innovative spirit and dedication to improving industry standards. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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